Allows
for the observation
of clear, flare-free
erect images
over a wide
field of view
(objective field
of view: 24mm,
best in class).
Allows
for the high-magnification
observation
of maximum
4000X with
long-working-distance
objectives.
Systems
for bright
field observation,
dark field
observation,
polarised
light observation,
and differential-interference
contrast observation
can be established
with a standard
configuration
(polarisation
unit and differential
filter are
optional).
A
maximum measuring
stroke of
300(X)x170(Y)x220(Z)mm
stage (best
in class)
incorporates
a quick-release
system and
a zero-set
button for
total ease
of operation.
Coarse
and fine focusing
handles are
mounted on both
sides of the
column.
Comes
with a variety
of optional
accessories
such as a rotary
table with a
fine-feed knob
and a high-intensity
metal halide
lamp.
A
CCD camera and
a digital camera
can be installed
via C-mount.
A
finger-span
positional design
has excellent
ergonomics.
The
one-body frame
with high
rigidity and
high vibration
resistance
is based on
FEM and vibration
analyses.
With
an ultra-wide
view-field
eyepiece (field
number 30)
and a long-working-distance
objective,
clear and
bright observation
images without
flare or ghosting
can be obtained.
Surface
observations
with bright-field,
bright-and-dark
field, polarisation
and differential
interference
contrast are
possible.
An
Infrared observation
system can be
established
with a concurrent
use of an IR
filter.
An
inward motor-driven
revolver ensures
a wide space
between the
lens surface
and the workpiece
in focus.
Ideal
as the microscope
unit of a prober
station for
semiconductors
(all models
CE marked).
Three
models are
available,
with applicability
to wavelength
ranges from
ultraviolet
radiation
(266nm) through
near-infrared
radiation
(1800nm).
Surface
observations
with bright
field, polarised
and differential
interference
contrast are
possible (varying
by model).
With
a wide variety
of optional
accessories
such as a
revolver with
centering
and parfocal
mechanisms,
a power focus
unit and a
power revolver,
any of various
microscope
systems can
be constructed.
An
inward revolver
ensures a wide
space between
the lens surface
and the workpiece
in focus.
This
assembly-type
microscope unit
can perform
continuous observation
from low magnification
through high
magnification
using a high-magnification
zoom system.
Three
wavelength
lasers (near
infrared,
visible, near
ultraviolet,
ultraviolet)
are supported.
An
automatic brightness-control
function is
provided as
standard for
the power-zoom
type.
A
model equipped
with a unique
sliding revolver
(two slots,
with centering
mechanism) is
also available.
Optical
- Vision Instruments
